NEW Pelcotec™ Etched Si CDMS-XY

NEW Pelcotec™ Etched Si CDMS-XYAvailable as NIST Traceable or as Certified against NIST Standard Easy to use and very useful for quick and precise SEM, FE SEM, FIB, CD SEM, LM, and AFM magnification calibration. Fiducial lines are provided in both X and Y axes for ease of 2 axis calibration without stage rotation. Fully featured and traceable calibration standards for a wide measurement range. They are made using the latest semiconductor and MEMS manufacturing techniques for

Physikalisch-Technischen Bundesanstalt

These competitively priced Smart Cut™ precision diamond wafering blades are designed to provide superior smooth surface quality

It is especially advantageous for slicing small or irregular shaped specimens as one might obtain from biopsies

Holder size is Ø50 x 10

(#16008) Unmounted or provided on an SEM specimen mount

and fluorescence studies where the highest optical quality is required

sterilizable

Ideal for quick spin-downs and microfiltration

polishing debris and to give the surface topography prior to SEM analysis

Numbering: OUTSIDE of Cavities

Available in 6

an example of a mounted sample